In Situ TEM Investigation of Homogenization Kinetics of Polycrystalline Ag

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In Situ TEM Investigation of Homogenization Kinetics of Polycrystalline Ag—Pd Film System

O. P. Kryshtal’, S. I. Bogatyrenko, R. V. Sukhov, O. O. Minenkov, A. I. Taliashvili

V.N. Karazin Kharkiv National University, 4 Svobody Sq., 61022 Kharkiv, Ukraine

Received: 12.08.2013. Download: PDF

The rate of diffusion mixing in layered film Ag—Pd system is studied using in situ electron microscopy. The effective diffusion coefficient in Ag—Pd system with a typical grain size of 4—7 nm is determined as $D \approx 10^{-17}-10^{-18}$ m$^{2}$/s at 280°C. This value is four orders of magnitude higher than that of the bulk one.

Key words: thin films, Ag—Pd system, in situ TEM heating, homogenization, diffusion coefficient.

URL: http://mfint.imp.kiev.ua/en/abstract/v36/i01/0031.html

DOI: https://doi.org/10.15407/mfint.36.01.0031

PACS: 61.46.-w, 64.75.+g, 66.30.-h,

Citation: O. P. Kryshtal’, S. I. Bogatyrenko, R. V. Sukhov, O. O. Minenkov, and A. I. Taliashvili, In Situ TEM Investigation of Homogenization Kinetics of Polycrystalline Ag—Pd Film System, Metallofiz. Noveishie Tekhnol., 36, No. 1: 31—38 (2014) (in Russian)

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