Dispersion Effects of Interconnection of the Scattering Pattern Dependences on Different Diffraction Conditions and Huge Intensification of These Dependences and Their Structure Sensitivity and Informativeness

L. M. Skapa, V. V. Lizunov, V. B. Molodkin, E. G. Len, B. V. Sheludchenko, S. V. Lizunova, O. S. Skakunova, M. G. Tolmachev, S. V. Dmitriev, R. V. Lekhnyak, G. O. Velikhovskii, V. V. Molodkin, I. M. Zabolotnyi, K. V. Fuzik, O. P. Vas’kevich

G. V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine

Received: 25.09.2015. Download: PDF

In this work, the quantum-mechanical quantitative analysis of features to increase the sensitivity and informativeness of multiple-scattering pattern to the imperfections of the crystal structure due to the use of dispersion effects of enormous diffraction-pattern structure dependence gain on various diffraction conditions are performed. The effects of interconnection of these patterns dependences on various diffraction conditions between themselves and with dependences on the defects’ characteristics and the changes in the selective sensitivity to the defects under variation of diffraction conditions are revealed. As shown, these effects are caused by dispersion mechanism. That substantially increases the possibilities of using the purposefully combined diffractometric data given at various diffraction conditions to increasing the informativeness of multiparametric diagnostics.

Key words: dynamical diffraction, dispersion mechanism, microdefects.

URL: http://mfint.imp.kiev.ua/en/abstract/v37/i11/1567.html

DOI: https://doi.org/10.15407/mfint.37.11.1567

PACS: 61.05.cc, 61.05.cf, 61.05.cp, 61.72.Dd, 61.72.Qq, 61.72.S-, 68.65.Ac

Citation: L. M. Skapa, V. V. Lizunov, V. B. Molodkin, E. G. Len, B. V. Sheludchenko, S. V. Lizunova, O. S. Skakunova, M. G. Tolmachev, S. V. Dmitriev, R. V. Lekhnyak, G. O. Velikhovskii, V. V. Molodkin, I. M. Zabolotnyi, K. V. Fuzik, and O. P. Vas’kevich, Dispersion Effects of Interconnection of the Scattering Pattern Dependences on Different Diffraction Conditions and Huge Intensification of These Dependences and Their Structure Sensitivity and Informativeness, Metallofiz. Noveishie Tekhnol., 37, No. 11: 1567—1582 (2015) (in Russian)


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