Issues »  Volume 38, Issue 3

Charge Transport in Polycrystalline Films of a Palladium of Nanometre Thickness

R. I. Bigun$^{1}$, V. M. Gavrylyukh$^{1}$, Z. V. Stasyuk$^{1}$, D. S. Leonov$^{2}$

$^{1}$Ivan Franko National University of Lviv, 50 Dragomanova Str., 79005 Lviv, Ukraine
$^{2}$Technical Center NAS of Ukraine, 13 Pokrovs’ka Str., 04070 Kyiv, Ukraine

Received: 02.02.2016. Download: PDF

Conductivity—thickness dependences in quench-condensed palladium ultrathin films are quantitatively described within the scope of the semiclassical and quantum size effect theories. The palladium thin films are prepared and investigated under ultrahigh vacuum conditions. The films are deposited on glass substrate or on glass substrate preliminary covered by germanium sublayers with mass thicknesses of 0.5 nm. The experimental data has a good agreement with the theoretical calculations, which take into account the peculiarities of the metal-films’ structure and the films’ surface morphology. Charge-transport parameters of thin films are calculated.

Key words: metal thin films, surface and grain boundary scatterings, semiconductor sublayers of subatomic thickness.

URL: http://mfint.imp.kiev.ua/en/abstract/v38/i03/0329.html

DOI: https://doi.org/10.15407/mfint.38.03.0329

PACS: 72.10.Fk, 73.23.Ad, 73.25.+i, 73.50.Bk, 73.61.At, 73.63.Bd, 81.15.Kk

Citation: R. I. Bigun, V. M. Gavrylyukh, Z. V. Stasyuk, and D. S. Leonov, Charge Transport in Polycrystalline Films of a Palladium of Nanometre Thickness, Metallofiz. Noveishie Tekhnol., 38, No. 3: 329—340 (2016) (in Ukrainian)

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