Issues »  Volume 39, Issue 2

Properties of the SnO$_{2}$-Based Thick Films When Using the Contact Pads Fabricated from Ni$_{3}$B-Paste

A. G. Gonchar$^{1}$, V. E. Sheludko$^{1}$, V. V. Kremenitsky$^{2}$, M. I. Siman$^{1}$, L. I. Fiyalka$^{1}$

$^{1}$I.M. Frantsevich Institute for Problems of Materials Sciences, NAS of Ukraine, 3 Academician Krzhizhanovskoho Str., UA-03680 Kyiv-142, Ukraine
$^{2}$Technical Center NAS of Ukraine, 13 Pokrovs’ka Str., 04070 Kyiv, Ukraine

Received: 22.02.2016; final version - 25.01.2017. Download: PDF

Properties of thick films based on the Sn$_{0,97}$Sb$_{0,03}$O$_{2}$ and SnO$_{2}$ powders, and their mixtures deposited on contact pads fabricated from Ni$_{3}$B-powder-based paste are investigated. The X-ray phase and X-ray spectrum analyses as well as electron microscopy are used. Volt-ampere characteristics, concentration and temperature dependences of electrical resistivity of films are determined. As revealed, the use of the contact pads fabricated from Ni$_{3}$B-pastes influences on the form of electrical-resistivity–temperature dependences of films.

Key words: thick film, contact pads, tin dioxide, temperature dependence of electrical resistivity.

URL: http://mfint.imp.kiev.ua/en/abstract/v39/i02/0177.html

DOI: https://doi.org/10.15407/mfint.39.02.0177

PACS: 07.07.Df, 68.55.-a, 73.61.-r, 81.05.Je, 82.47.Rs, 83.80.Hj, 85.40.Xx

Citation: A. G. Gonchar, V. E. Sheludko, V. V. Kremenitsky, M. I. Siman, and L. I. Fiyalka, Properties of the SnO$_{2}$-Based Thick Films When Using the Contact Pads Fabricated from Ni$_{3}$B-Paste, Metallofiz. Noveishie Tekhnol., 39, No. 2: 177—188 (2017) (in Russian)

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