Weak Localization as a Possible Cause of the Peculiarities of Electrical Resistivity Temperature Dependence of the Amorphous Cobalt-Based Alloys

Issues » Volume 36, Issue 2

M. P. Semen’ko

Taras Shevchenko National University of Kyiv, 64 Volodymyrska Str., 01601 Kyiv, Ukraine

Received: 10.12.2012; final version - 24.12.2013. Download: PDF

Temperature dependences of the electrical resistivity, $R(T)$, of the amorphous Сo$_{80-x}$Fe$_{x}$B$_{20}$ alloys ($2 \leq x \leq 20$) are investigated and analysed. As argued, the revealed peculiarities in the $R(T)$ curves arise not only due to the disordered atomic structure, but also due to the weak localisation effects. The possible influence of electronic structure of the alloys on these effects is discussed.

Key words: amorphous alloys, electrical resistance, diffraction model, weak localization.

URL: http://mfint.imp.kiev.ua/en/abstract/v36/i02/0195.html

DOI: https://doi.org/10.15407/mfint.36.02.0195

PACS: 72.15.Cz, 72.15.Rn, 73.20.Fz, 75.50.Kj

Citation: M. P. Semen’ko, Weak Localization as a Possible Cause of the Peculiarities of Electrical Resistivity Temperature Dependence of the Amorphous Cobalt-Based Alloys, Metallofiz. Noveishie Tekhnol., 36, No. 2: 195—204 (2014) (in Ukrainian)

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