Issues »  Volume 36, Issue 4

Formation of Metallic Electrical Conduction in Films of Vacuum Condensates of Metals

R. I. Bigun$^{1}$, M. D. Buchkovska$^{1}$, V. M. Gavrilyukh$^{1}$, O. E. Kravchenko$^{1}$, Z. V. Stasyuk$^{1}$, D. S. Leonov$^{2}$

$^{1}$Ivan Franko National University of Lviv, 50 Dragomanova Str., 79005 Lviv, Ukraine
$^{2}$Technical Center NAS of Ukraine, 13 Pokrovs’ka Str., 04070 Kyiv, Ukraine

Received: 01.02.2014. Download: PDF

The results of investigation of the electronic-transport phenomena in ultrathin copper, gold, nickel, and palladium films of subatomic thickness, which are deposited by frozen condensation on the surface of both glass and germanium surfactant sublayers, are analysed. The possibility of control of the crystallites’ linear sizes in the plane, which is parallel to the substrate, by changing of the thickness of surfactant sublayers is confirmed. The electronic structure of electrically continuous copper and gold films with the thickness of at least 5—6 nm and electrically continuous nickel and palladium films with the thickness of 4—5 nm or larger remain similar to the electronic structure of bulk metals.

Key words: surface and grain boundary scattering, thin metal films, semiconductor sublayers of subatomic thickness.

URL: http://mfint.imp.kiev.ua/en/abstract/v36/i04/0531.html

DOI: https://doi.org/10.15407/mfint.36.04.0531

PACS: 61.72.Hh, 72.10.Fk, 73.25.+i, 73.50.Bk, 73.50.Lw, 73.61.At, 81.15.Ef

Citation: R. I. Bigun, M. D. Buchkovska, V. M. Gavrilyukh, O. E. Kravchenko, Z. V. Stasyuk, and D. S. Leonov, Formation of Metallic Electrical Conduction in Films of Vacuum Condensates of Metals, Metallofiz. Noveishie Tekhnol., 36, No. 4: 531—546 (2014) (in Ukrainian)

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