Investigation of Plasmon Gold Film Nanostructures by Means of both X-Ray Reflectometry and Diffractometry

Issues » Volume 37, Issue 9

O. Y. Gudymenko, S. B. Kryvyi, H. V. Stanchu, V. P. Kladko, N. V. Safryuk, M. V. Slobodian

V. E. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41 Nauky Ave., UA-03028 Kyiv, Ukraine

Received: 07.05.2015. Download: PDF

The Au and por-Au films obtained by pulsed-laser deposition are characterized by X-ray reflectometry and diffractometry. The main structural parameters (density (porosity), thickness, surface roughness) are obtained. As shown, the additional measurements of the lattice parameter allow more correctly determine the porosity value of the Au films.

Key words: X-ray reflectometry and diffractometry, thickness of nanocomposite films, porosity, gold nanoparticles.

URL: http://mfint.imp.kiev.ua/en/abstract/v37/i09/1215.html

DOI: https://doi.org/10.15407/mfint.37.09.1215

PACS: 61.05.cm, 61.05.cp, 61.43.Gt, 73.20.Mf, 78.67.Rb, 81.15.Fg, 81.16.Mk

Citation: O. Y. Gudymenko, S. B. Kryvyi, H. V. Stanchu, V. P. Kladko, N. V. Safryuk, and M. V. Slobodian, Investigation of Plasmon Gold Film Nanostructures by Means of both X-Ray Reflectometry and Diffractometry, Metallofiz. Noveishie Tekhnol., 37, No. 9: 1215—1223 (2015) (in Russian)

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