Issues »  Volume 40, Issue 7

Influence of Sublayers of Germanium on Optical Conductivity of Thin Films of Gold

R. I. Bihun$^{1}$, Z. V. Stasyuk$^{1}$, O. V. Stroganov$^{1}$, D. S. Leonov$^{2}$

$^{1}$Ivan Franko National University of Lviv, 1 Universytets’ka Str., UA-79000 Lviv, Ukraine
$^{2}$Technical Centre, NAS of Ukraine, 13 Pokrovs’ka Str., UA-04070 Kyiv, Ukraine

Received: 25.05.2018. Download: PDF

Features of the optical absorption and percolation inside the thin Au films of different thicknesses (2–20 nm) and influence of 0.5 nm thickness Ge sublayers on them in the visible and near infrared regions are experimentally investigated. The structural properties of metal films have main impact on their optical and electrical percolations. As shown, 0.5 nm Ge sublayers shift optical percolation of Au films into the region of lower thicknesses to $\Delta d$ = 2.4 nm. Such samples have higher optical absorption, in the contrary to Au films deposited on bare glass substrate, because of more fine polycrystalline structure of Au films and higher concentration of isolated metal islands on the unit surface of glass substrate.

Key words: thin metal films, sublayers of subatomic thickness, optical and electrical percolations.

URL: http://mfint.imp.kiev.ua/en/abstract/v40/i07/0931.html

DOI: https://doi.org/10.15407/mfint.40.07.0931

PACS: 64.60.ah, 73.50.Gr, 73.61.At, 73.63.Bd, 78.20.Ci, 78.66.Bz, 81.15.Kk

Citation: R. I. Bihun, Z. V. Stasyuk, O. V. Stroganov, and D. S. Leonov, Influence of Sublayers of Germanium on Optical Conductivity of Thin Films of Gold, Metallofiz. Noveishie Tekhnol., 40, No. 7: 931—953 (2018) (in Ukrainian)

REFERENCES
  1. A. Axelevitch, B. Gorenstein, and G. Golan, Physics Procedia, 32: 1 (2012). Crossref
  2. P. Smilauer, Contemporary Physics, 32, No. 2: 89 (1991). Crossref
  3. S. Ding, X. Wang, D. J. Chen, and Q. Q. Wang, Optics Express, 14, No. 4: 1541 (2006). Crossref
  4. R. I. Bihun, Z. V. Stasyuk, O. V. Stroganov, V. M. Gavrylyukh, and D. S. Leonov, Nanosistemi, Nanomateriali, Nanotehnologii, 13, No. 3: 459 (2015) (in Ukrainian).
  5. R. I. Bihun, Z. V. Stasyuk, O. V. Stroganov, and D. S. Leonov, Metallofiz. Noveishie Tekhnol., 39, No. 6: 743 (2017) (in Ukrainian). Crossref
  6. S. V. Dukarov, S. I. Petrushenko, V. N. Sukhov, and I. G. Churilov, Problems Atomic Sci. Technol., 89, No. 1: 110 (2014).
  7. N. Kaiser, Appl. Optics, 41, No. 16: 3053 (2002). Crossref
  8. N. T. Gladkikh, S. V. Dukarov, and V. N. Sukhov, Fizika Metallov i Metallovedenie, 78, No. 3: 87 (1994).
  9. S. I. Petrushenko, S. V. Dukarov, V. N. Sukhov, and I. G. Churilov, Journal of Nano- and Electronic Physics, 7, No. 2: 02033(6) (2015) (in Russian).
  10. R. I. Bigun, V. M. Gavrylyukh, Z. V. Stasyuk, and D. S. Leonov, Metallofiz. Noveishie Tekhnol., 37, No. 3: 317 (2015) (in Ukrainian). Crossref
  11. M. Cesaria, A. P. Caricato, and M. Martino, J. Opt., 14: 105701 (2012). Crossref
  12. X. Sun, R. Hong, H. Hon, Zh. Fan, and J. Shao, Thin Solid Films, 515: 6962 (2007). Crossref
  13. N. A. Hegab and H. M. El-Mallah, Acta Physica Polonica A, 118, No. 4: 637 (2010). Crossref
  14. R. T. Phillips, J. Phys. D: Appl. Phys., 16: 489 (1983). Crossref
  15. R. E. Denton, R. D. Campbell, and S. G. Tomlin, J. Phys. D: Appl. Phys., 5: 852 (1972). Crossref
  16. P. B. Johnson and R. W. Christy, Phys. Rev. B, 6, No. 12: 4370 (1972). Crossref
  17. N. El-Kadry, Acta Physica Polonica A, 86: 375 (1994). Crossref
  18. CRC Handbook of Chemistry and Physics: A Ready-Reference of Chemical and Physical Data. 85th Ed. (Ed. D. R. Line) (Boca Raton, FL: CRC Press LLC: 2004), J. Am. Chem. Soc., 127, No. 12: 4542 (2005). Crossref
  19. M. A. Ordal, R. J. Bell, R. W. Alexander, L. L. Long, and M. R. Querry, Applied Optics, 24, No. 24: 4493 (1985). Crossref
  20. A. I. Maaroof and G.B. Smith, Thin Solid Films, 485: 198 (2005). Crossref
  21. Y. Jiang, S. Pillai, and M. A. Green, J. Appl. Phys., 120: 233109 (2016). Crossref
  22. A. F. Mayadas, M. Shatzkes, and J. F. Janak, Appl. Phys. Lett., 14, Iss. 11: 345 (1969). Crossref
  23. A. F. Mayadas and M. Shatzkes, Phys. Rev. B: Solid State, B4: 1382 (1970). Crossref
  24. C. R. Tellier and A. J. Tosser, Thin Solid Films, 33: L19 (1976). Crossref
  25. C. R. Tellier and A. J. Tosser, Thin Solid Films, 44: 141 (1977). Crossref
  26. C. R. Tellier, A. J. Tosser, and C. Boutrit, Thin Solid Films, 44: 201 (1977). Crossref
  27. C. R. Tellier, Thin Solid Films, 51, No. 3: 311 (1978). Crossref
  28. C. R. Tellier and A. J. Tosser, Size Effects in Thin Solid Films (Amsterdam: Elsevier: 1982).
  29. C. R. Pichard, C. R. Tellier, and A. J. Tosser, Thin Solid Films, 62, No. 2: 189 (1979). Crossref
  30. C. R. Pichard, C. R. Tellier, and A. J. Tosser, J. Phys. F: Metal. Phys., 10: L101 (1980). Crossref
  31. M. Bedda, C. R. Pichard, and A. J. Tosser, J. Mat. Sci., 21: 1405 (1986). Crossref
  32. H. Tijani, S. Messaadi, C. R. Pichard, and A. J. Tosser. J. Mat. Sci., 23, No. 1: 293 (1988). Crossref
  33. A. J. Tosser, C. R. Pichard, M. Lahrichi, and M. Bedda, J. Mat. Sci. Lett., 4, No. 5: 585 (1985). Crossref

© 2013–2017 "G.V. Kurdyumov Institute for Metal Physics"