Determination of Local Deformations and Their Anisotropy in Polycrystalline Ge by Electron Backscatter Diffraction Data

Issues » Volume 41, Issue 3

I. M. Fodchuk$^{1}$, M. S. Solodkyi$^{1}$, M. D. Borcha$^{1}$, S. V. Balovsyak$^{1}$, V. M. Tkach$^{2}$

$^{1}$Yuriy Fedkovych Chernivtsi National University, 2 Kotsyubynsky Str., UA-58012 Chernivtsi, Ukraine
$^{2}$V.M. Bakul Institute for Superhard Materials, NAS of Ukraine, 2 Avtozavods’ka Str., UA-04074 Kyiv, Ukraine

Received: 11.10.2018. Download: PDF

A new approach of local average strain determination obtained from the data of electron backscatter diffraction in the local region of polycrystalline samples with a diamond lattice is proposed. A discrete two-dimensional Fourier transform and the power Fourier spectrum are used to analyse the shape and area changes of the intensity profile of the Kikuchi bands. The degree of bands tailing in Kikuchi pattern is related with the deformation values, which are quantitatively described by the changes of average radial period and the radial distribution area of the energy spectrum of the image.

Key words: polycrystalline Ge, electron backscatter diffraction, Kikuchi method, Fourier transform, power Fourier spectrum, deformation.

URL: http://mfint.imp.kiev.ua/en/abstract/v41/i03/0403.html

DOI: https://doi.org/10.15407/mfint.41.03.0403

PACS: 61.05.jm, 61.72.Dd, 61.72.Mm, 61.72.uf, 68.35.bg, 68.35.Gy

Citation: I. M. Fodchuk, M. S. Solodkyi, M. D. Borcha, S. V. Balovsyak, and V. M. Tkach, Determination of Local Deformations and Their Anisotropy in Polycrystalline Ge by Electron Backscatter Diffraction Data, Metallofiz. Noveishie Tekhnol., 41, No. 3: 403—415 (2019) (in Russian)

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