Angular dependences of ellipsometric parameters $\psi$ and $\Delta$ at external reflection as well as an internal reflection coefficient are experimentally measured for hybrid structures based on thin Au, Ag or Cu films protected by dielectric layers HfO$_2$ or MgF$_2$. Using numerical matrix method, appropriate angular dependences for such multilayer systems are calculated. Despite of the differences obtained at modelling of optical parameters of the objects between the ordinary (external reflection) and plasmonic (internal reflection) modes, the theoretical results are in good agreement with the experimental data. Angular positions of plasmonic attenuated internal reflection minima in Kretschmann geometry for the samples are calculated as functions of a refractive index $n$ of a substance deposited onto appropriate samples. The shift of these minima is practically the same for each of the structures studied and amounts about of 100 deg/RIU in the vicinity of $n$ = 1.20. This allows one to estimate the performance of given heterostructures functioning as sensors grounded on the effect of surface plasmon resonance.