Simulation and Diagnostics of Strains in the Subsurface Layers of Gadolinium—Gallium Garnet Single Crystals Implanted with F$^{+}$ Ions
V. О. Kotsyubynskyy$^{1}$, V. M. Pylypiv$^{1}$, B. K. Ostafiychuk$^{1}$, I. P. Yaremiy$^{1}$, O. Z. Garpul’$^{1}$, E. S. Skakunova$^{2}$, V. B. Molodkin$^{2}$, S. I. Olikhovskyy$^{2}$
$^{1}$Vasyl Stefanyk Precarpathian National University, 57 Shevchenko Str., 76018 Ivano-Frankivsk, Ukraine
$^{2}$G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03680 Kyiv-142, Ukraine
Received: 17.06.2014. Download: PDF
Elastic strain distributions through depth in the subsurface layer of gadolinium—gallium garnet single crystals implanted by F$^{+}$ ions with energy of 90 keV are determined by means of the high-resolution X-ray diffraction measurement data processing with using the statistical dynamical theory of X-ray diffraction in imperfect crystals. The dependences of strained-crystal characteristics on the implantation dose are analysed.
Key words: strain, ion implantation, gadolinium—gallium garnet, statistical dynamical theory of X-ray diffraction.
URL: http://mfint.imp.kiev.ua/en/abstract/v36/i08/1049.html
DOI: https://doi.org/10.15407/mfint.36.08.1049
PACS: 61.05.cp, 61.72.Dd, 61.72.Hh, 61.80.Jh, 61.82.Fk, 68.55.Ln
Citation: V. О. Kotsyubynskyy, V. M. Pylypiv, B. K. Ostafiychuk, I. P. Yaremiy, O. Z. Garpul’, E. S. Skakunova, V. B. Molodkin, and S. I. Olikhovskyy, Simulation and Diagnostics of Strains in the Subsurface Layers of Gadolinium—Gallium Garnet Single Crystals Implanted with F$^{+}$ Ions, Metallofiz. Noveishie Tekhnol., 36, No. 8: 1049—1057 (2014) (in Ukrainian)