The paper establishes and analyses quantitatively the difference in the deformation dependences (DD) of coherent ($R_{ib}$) and diffuse ($R_{id}$) components of the total integrated intensity of dynamical diffraction (TIIDD) for both of these ones and for each one of the various types of defects, if such are available simultaneously in the single-crystal sample. This provides the possibility of parameters’ determination in principle for the different types of defects, using the diffraction conditions as well the variation of different segments of the DD TIIDD with sharp DD of $R_{id}/R_{ib}$ (i.e. of the diffuse component cont$R_{ib}$ution). As shown, if the Laue-diffraction conditions vary from ones corresponding to the thick-crystal approximation to ones corresponding to the thin-crystal approximation, and with expansion of the elastic strain range of variability, it becomes possible to control both the interval and the pattern of change of the $R_{id}/R_{ib}$ relation. As a result, one can control the sensitivity of the DD TIIDD to the type and characteristics of microdefects.