Josephson Junctions with the Increased Value of a Characteristic Voltage

V. E. Shaternik$^{1}$, A. P. Shapovalov$^{2}$, A. V. Shaternik$^{2}$, T. A. Prikhna$^{2}$

$^{1}$G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03680 Kyiv-142, Ukraine
$^{2}$V. Bakul Institute for Superhard Materials NAS of Ukraine, 2 Avtozavods’ka Str., 04074 Kyiv, Ukraine

Received: 21.01.2016. Download: PDF

By using vacuum deposition and shadow-masks’ technique, there are fabricated and investigated Josephson proximity MgB$_{2}$—Al—Al$_{2}$O$_{3}$—MoRe junctions and Josephson resonance-percolation MgB$_{2}$—Si(W)—MoRe junctions based on the magnesium diboride (MgB$_{2}$) thin films. The increased values of the characteristic voltage I$_{C}$R$_{N}$ = 30—38 mV of fabricated MgB$_{2}$—Si(W)—MoRe junctions give a possibility to increase DC SQUID sensitivity by several times as a result of the increasing of their flux-to-voltage transfer coefficient.

Key words: superconductivity, magnesium diboride, Josephson junctions, DC SQUID, thin films, flux-to-voltage transfer coefficient.



PACS: 73.23.-b, 73.40.Gk, 73.40.Ns, 74.50.+r, 74.70.Ad, 85.25.Am, 85.25.Cp, 85.25.Dq

Citation: V. E. Shaternik, A. P. Shapovalov, A. V. Shaternik, and T. A. Prikhna, Josephson Junctions with the Increased Value of a Characteristic Voltage, Metallofiz. Noveishie Tekhnol., 38, No. 3: 319—328 (2016) (in Russian)

  1. K. Chen, D. Cunnane, Y. Shen, X. X. Xi, A. Kleinsasser, and J. Rowell, Appl. Phys. Lett., 100, No. 12: 122601 (2012). Crossref
  2. H. Shimakage and Z. Wang, J. Appl. Phys., 105, No. 1: 013918 (2009). Crossref
  3. H. Shimakage, K. Tsujimoto, Z. Wang, and M. Tonouchi, Appl. Phys. Lett., 86, No. 7: 072512 (2005). Crossref
  4. K. Ueda, S. Saito, K. Semba, T. Makimoto, and M. Naito, Appl. Phys. Lett., 86, No. 17: 172502 (2005). Crossref
  5. H. Shim, K. Yoon, J. Moodera, and J. Hong, Appl. Phys. Lett., 90, No. 21: 212509 (2007). Crossref
  6. T. Kim and J. Moodera, J. Appl. Phys., 100, No. 11: 113904 (2006). Crossref
  7. M. Costache and J. Moodera, Appl. Phys. Lett., 96, No. 8: 082508 (2010). Crossref
  8. K. Elsabawy, RSC Advances, 1, No. 6: 964 (2011). Crossref
  9. R. Singh, R. Gandikota, J. Kim, N. Newman, and J. Rowell, Appl. Phys. Lett., 89, No. 4: 042512 (2006). Crossref
  10. E. Galan, D. Cunnane, X. X. Xi, and K. Chen, Supercond. Sci. Technol., 27, No. 6: 065015 (2014). Crossref
  11. T. Melbourne, D. Cunnane, E. Galan, X. X. Xi, and K. Chen, IEEE Transactions, Applied Superconductivity, 25, No. 3: 1 (2014). Crossref
  12. The SQUID Handbook (Eds. J. Clarke and A. I. Braginski) (Weinheim: WILEY-VCH Verlag GmbH & Co. KGaA: 2004), vol. I.
  13. Superconductors—Properties, Technology, and Applications (Ed. Y. Grigorashvili) (ISBN 978-953-51-0545-9, Published: April 20, 2012 under CC BY 3.0 license).
  14. D. Cunnane, E. Galan, K. Chen, and X. X. Xi, Appl. Phys. Lett., 103, No. 21: 212603 (2013). Crossref
  15. S. Cybart, T. Wong, E. Cho, J. Beeman, C. Yung, B. Moeckly, and R. Dynes, Appl. Phys. Lett., 104, No. 18: 182604 (2014). Crossref
  16. D. Cunnane, N. Acharya, M. Wolak, X. X. Xi, and B. Karasik, Proc. of the 26th International Symposium on Space Terahertz Technology (ISSTT 2015) (March 16–18, 2015) (Cambridge, MA, USA: ISSTT Conf. Publ.: 2015), p. M2–2.
  17. V. Shaternik, M. Belogolovskii, T. Prikhna, A. Shapovalov, O. Prokopenko, D. Jabko, O. Kudrja, O. Suvorov, and V. Noskov, Physics Procedia, 36: 94 (2012). Crossref
  18. V. Shaternik, A. Shapovalov, M. Belogolovskii, O. Suvorov, S. Döring, S. Schmidt, and P. Seidel, Material Research Express, 1, No. 2: 026001 (2014). Crossref
  19. V. Shaternik, A. Shapovalov, A. Suvorov, S. Doring, S. Schmidt, and P. Seidel, Proc. of 8th International Kharkov Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW 2013) (June 23–28, 2013) (Kharkov: IEEE Conf. Publ.: 2013), p. 655.
  20. I. M. Lifshitz and V. Ya. Kirpichenkov, ZhETF, 77, No. 3: 989 (1979) (in Russian).
  21. G. E. Blonder, M. Tinkham, and T. M. Klapwijk, Phys. Rev. B, 25, No. 7: 4515 (1982). Crossref