Determination of a Thickness of Layers of Multilayer Periodic Coatings by a Method of the Rutherford Backscattering

V. N. Kolomiyets$^{1}$, I. N. Kononenko$^{1}$, S. N. Kravchenko$^{1}$, M. I. Zakharets$^{1}$, V. Yu. Storizhko$^{1}$, V. I. Vozny$^{1}$, A. N. Buhay$^{1}$, A. Yu. Devizenko$^{2}$

$^{1}$Institute of Applied Physics, NAS of Ukraine, 58 Petropavlivska Str., 40000 Sumy, Ukraine
$^{2}$National Technical University ‘Kharkiv Polytechnic Institute’, 21 Kyrpychov Str., 61002 Kharkiv, Ukraine

Received: 10.05.2016. Download: PDF

The periodic multilayer [Со/С]$_{10}$ coating is deposited by means of the magnetron sputtering. The thicknesses of the cobalt and carbon layers are determined by the Rutherford backscattering (RBS) method. These results are in a good agreement (with divergence less than 6%) with results of simulation of small-angle X-ray diffraction.

Key words: periodic of multilayer coating, Rutherford backscattering, small-angle X-ray diffraction.

URL: http://mfint.imp.kiev.ua/en/abstract/v38/i06/0815.html

DOI: https://doi.org/10.15407/mfint.38.06.0815

PACS: 29.30.Ep, 34.50.-s, 61.05.cf, 61.05.cp, 68.55.J-, 81.15.Cd, 82.80.Yc

Citation: V. N. Kolomiyets, I. N. Kononenko, S. N. Kravchenko, M. I. Zakharets, V. Yu. Storizhko, V. I. Vozny, A. N. Buhay, and A. Yu. Devizenko, Determination of a Thickness of Layers of Multilayer Periodic Coatings by a Method of the Rutherford Backscattering, Metallofiz. Noveishie Tekhnol., 38, No. 6: 815—823 (2016) (in Russian)


REFERENCES
  1. Nanostrukturnye Materialy [Nanostructure Control of Materials] (Eds. R. H. J. Hannink and A. J. Hill) (Moscow: Tekhnosfera: 2009) (Russian translation).
  2. I. A. Zhuravel', Ye. A. Bugayev, A. Yu. Devizenko, Yu. P. Pershin, and V. V. Kondratenko, Physical Surface Engineering, 9, No. 2: 134 (2011) (in Russian).
  3. H. B. Kovalenko, S. V. Mytnichenko, and V. A. Chernov, Poverkhnost', No. 1: 55 (2002) (in Russian).
  4. E. A. Bugaev, O. Yu. Devizenko, E. M. Zubarev, V. A. Sevryukova, and V. V. Kondratenko, Metallofiz. Noveishie Tekhnol., 30, No. 11: 1533 (2008) (in Russian).
  5. K. Oura, V. G. Lifshits, A. A. Saranin, A. V. Zotov, and M. Katayama, Vvedenie v Fiziku Poverkhnosti [Surface Science: An Introduction] (Moscow: Nauka: 2006) (in Russian).
  6. Ye. A. Bugayev, Physical Surface Engineering, 10, No. 1: 59 (2012) (in Russian).
  7. O. M. Buhay, A. A. Drozdenko, M. I. Zakharets, I. G. Ignat'ev, A. B. Kramchenkov, V. I. Miroshnichenko, A. G. Ponomarev, and V. E. Storizhko, Physics Procedia, 66: 166 (2015). Crossref
  8. A. A. Drozdenko, V. L. Denisenko, A. B. Dudnik, M. I. Zakharets, A. B. Kramchenkov, V. V. Kuprienko, N. A. Sayko, and V. E. Storizhko, Vestnik SumGU. Seriya: Fizika, Matematika, Mekhanika, No. 2: 60 (2008) (in Russian).
  9. A. V. Vinogradov, I. A. Brytov, and A. Ya. Grudsky, Zerkal'naya Rentgenovskaya Optika [Mirror X-Ray Optics] (Leningrad: Mashinostroenie: 1989) (in Russian).
  10. B. L. Henke, E. M. Gullikson, and J. C. Davis, Atomic Data and Nuclear Data Tables, 54, No. 2: 181 (1993). Crossref
  11. J. C. Bravman and R. Sinclair, J. Electron Microscopy. Tech., 1, No. 1: 53 (1984). Crossref
  12. J. Mayer, SIMNRA User's Guide. Report IPP 9/113 (Garching, Germany: Max-Planck-Institut für Plasmaphysik: 1997).