Issues »  Volume 39, Issue 1

Effects of Total Multiplicity of Diffuse Scattering in Crystals Containing the Second-Class Defects According to Krivoglaz’s Classification

S. V. Dmitriev, V. B. Molodkin, M. G. Tolmachev, O. S. Skakunova, S. V. Lizunova, R. V. Lekhnyak, K. V. Fuzik, G. O. Velikhovskii, O. P. Vaskevich, V. V. Lizunov, A. A. Katasonov, I. E. Golentus, S. I. Olikhovskii, L. M. Skapa, V. V. Molodkin

G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03680 Kyiv-142, Ukraine

Received: 28.12.2016. Download: PDF

The theoretical model of dynamical diffraction of X-rays in crystals with defects of arbitrary types, which takes into account effects of total (not only by means of the second order of disturbance theory) multiplicity of diffuse and coherent waves’ scattering by fluctuating part of intracrystalline potential, are constructed. Particularly, expressions for dispersion corrections for coherent and diffuse wave fields, which take into account a total multiplicity of scattering on periodic and fluctuating parts of intracrystalline potential, are obtained. Necessity and sufficiency of the use of mentioned corrections in formulas for diffraction intensity for diagnostics of the second-class defects within the M. O. Krivoglaz classification are shown.

Key words: dynamical diffraction, diffuse scattering, dispersion mechanism, multiplicity of diffuse scattering, microdefects.

URL: http://mfint.imp.kiev.ua/en/abstract/v39/i01/0001.html

DOI: https://doi.org/10.15407/mfint.39.01.0001

PACS: 61.05.cc, 61.05.cf, 61.05.cp, 61.72.Dd, 61.72.Lk, 61.72.Qq

Citation: S. V. Dmitriev, V. B. Molodkin, M. G. Tolmachev, O. S. Skakunova, S. V. Lizunova, R. V. Lekhnyak, K. V. Fuzik, G. O. Velikhovskii, O. P. Vaskevich, V. V. Lizunov, A. A. Katasonov, I. E. Golentus, S. I. Olikhovskii, L. M. Skapa, and V. V. Molodkin, Effects of Total Multiplicity of Diffuse Scattering in Crystals Containing the Second-Class Defects According to Krivoglaz’s Classification, Metallofiz. Noveishie Tekhnol., 39, No. 1: 1—9 (2017) (in Ukrainian)

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