The Physical Nature and Methodological Grounds of Diagnostics with Use of Effect of Asymmetry of Azimuthal Dependence of the Total Integrated Intensity of a Dynamical X-Ray Diffraction in Crystals with the Disturbed Surface Layer
V. B. Molodkin$^{1}$, A. I. Nizkova$^{1}$, E. I. Bogdanov$^{1}$, V. V. Lizunov$^{1}$, N. G. Tolmachev$^{2}$, S. V. Dmitriev$^{1}$, Y. V. Vasylyk$^{1}$, S. V. Lizunova$^{1}$, A. G. Karpov$^{2}$, O. G. Voitok$^{2}$, V. P. Pochekuev$^{2}$
$^{1}$G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine
$^{2}$LLC ‘Centre of Advanced Diagnostics’, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine
Received: 19.05.2017. Download: PDF
Detailed analysis of physical nature is carried out and methodological grounds are developed for diagnostics with using discovered by authors effect of asymmetry of azimuthal dependence (AD) of total integrated intensity of dynamical diffraction (TIIDD) of x-rays normalized to the perfect-crystal TIIDD AD. Allowing for this asymmetry appeared due to interference of beams diffracted in both kinematically and dynamically scattered layers and increased with increasing of kinematically scattered-layer thickness, the practical grounds of non-destructive methods for experimental determination of layer thickness are developed.
Key words: dynamical diffraction, azimuthal dependence, total integrated intensity, disturbed surface layer (DSL).
URL: http://mfint.imp.kiev.ua/en/abstract/v39/i06/0753.html
DOI: https://doi.org/10.15407/mfint.39.06.0753
PACS: 61.05.C-, 61.72.Dd, 68.49.Uv, 68.65.Ac, 81.70.Fy
Citation: V. B. Molodkin, A. I. Nizkova, E. I. Bogdanov, V. V. Lizunov, N. G. Tolmachev, S. V. Dmitriev, Y. V. Vasylyk, S. V. Lizunova, A. G. Karpov, O. G. Voitok, and V. P. Pochekuev, The Physical Nature and Methodological Grounds of Diagnostics with Use of Effect of Asymmetry of Azimuthal Dependence of the Total Integrated Intensity of a Dynamical X-Ray Diffraction in Crystals with the Disturbed Surface Layer, Metallofiz. Noveishie Tekhnol., 39, No. 6: 753—765 (2017) (in Russian)