Issues »  Volume 40, Issue 5

Applied Capabilities of X-Ray Topography of Crystals in the Skew-Asymmetric Bragg Diffraction

I. M. Fodchuk$^{1}$, R. A. Zaplitnyy$^{1}$, Yu. T. Roman$^{1}$, V. B. Molodkin$^{2}$, T. P. Vladimirova$^{2}$, Z. Świątek$^{3}$

$^{1}$Yuriy Fedkovych Chernivtsi National University, 2 Kotsyubynsky Str., UA-58012 Chernivtsi, Ukraine
$^{2}$G. V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine
$^{3}$Institute of Metallurgy and Materials Science, Polish Academy of Science, 25 Reymonta Str., 30-059 Krakow, Poland

Received: 03.03.2018. Download: PDF

The applied capabilities of use of modified Berg–Barrett topographic method in the skew-asymmetric x-ray Bragg diffraction setup for the study of morphology and structural changes near crystal surface are shown. A controlled change in the extinction depth of x-ray penetration opens up new possibilities for investigation of structural changes in semiconductor materials after various external influences.

Key words: x-ray diffraction, x-ray topography, structural diagnostics, Berg–Barrett method.

URL: http://mfint.imp.kiev.ua/en/abstract/v40/i05/0561.html

DOI: https://doi.org/10.15407/mfint.40.05.0561

PACS: 07.85.-m, 41.50.+h, 61.05.C-, 61.72.Ff, 68.55.J-, 68.55.Ln, 81.05.Dz

Citation: I. M. Fodchuk, R. A. Zaplitnyy, Yu. T. Roman, V. B. Molodkin, T. P. Vladimirova, and Z. Świątek, Applied Capabilities of X-Ray Topography of Crystals in the Skew-Asymmetric Bragg Diffraction, Metallofiz. Noveishie Tekhnol., 40, No. 5: 561—583 (2018) (in Russian)

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