Effect of Sputtering Power on Optoelectronic Properties of Iron-Doped Indium Saving Indium-Tin Oxide Thin Films
M. Ohtsuka1, R. Sergiienko2, S. Petrovska3, B. Ilkiv3, T. Nakamura1
1Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2 Chome-1-1 Katahira, Aoba Ward, Sendai, Miyagi 980-0812, Japan
2Physico-Technological Institute of Metals and Alloys, NAS of Ukraine, 34/1 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine
3I. M. Frantsevich Institute for Problems in Materials Science, NAS of Ukraine, 3 Academician Krzhyzhanovsky Str., UA-03142 Kyiv, Ukraine
Received: 22.10.2018; final version - 12.02.2019. Download: PDF
Iron-doped indium-tin oxide (ITO) thin films with reduced to 50% mass indium oxide content are deposited onto glass substrates preheated at 523 K by co-sputtering of ITO and Fe2O3 targets in mixed argon-oxygen atmosphere. The influence of different radio frequency (RF) plasma power for deposition of Fe2O3 target on the electrical, optical, structural, and morphological properties of the films is investigated by means of four point probe, Ultraviolet–Visible–Infrared (UV–Vis–IR) spectroscopy, X-ray diffraction and atomic force microscopy methods. The volume resistivity of 930 μΩ⋅cm and transmittance over 85% are obtained for thin films sputtered under optimum conditions. Iron doping results in significant improvement in films transmittance and increasing the crystallization temperature of ITO thin films.
Key words: iron-doped indium-tin oxide, electrical properties, optical properties, magnetron direct current sputtering, radio frequency deposition.
URL: http://mfint.imp.kiev.ua/en/abstract/v41/i07/0941.html
DOI: https://doi.org/10.15407/mfint.41.07.0941
PACS: 61.05.cp, 68.37.Ps, 68.55.J-, 73.61.At, 78.66.Bz, 81.15.Cd
Citation: M. Ohtsuka, R. Sergiienko, S. Petrovska, B. Ilkiv, and T. Nakamura, Effect of Sputtering Power on Optoelectronic Properties of Iron-Doped Indium Saving Indium-Tin Oxide Thin Films, Metallofiz. Noveishie Tekhnol., 41, No. 7: 941—952 (2019)