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Issues »  Volume 43, Issue 10

High-Resolution X-Ray Diffractometry of Crystalline Compounds with Developed Dislocation Structure

I. M. Fodchuk1, A. R. Kuzmin1, I. I. Gutsuliak1, M. S. Solodkyi1, O. L. Maslyanchuk1, Yu. T. Roman1, V. P. Kladko2, O. Yo. Gudymenko2, V. B. Molodkin3, V. V. Lizunov3

1Yuriy Fedkovych Chernivtsi National University, 2 Kotsyubynsky Str., UA-58012 Chernivtsi, Ukraine
2V. E. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41 Nauky Ave., UA-03028 Kyiv, Ukraine
3G. V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine

Received: 16.06.2021. Download: PDF

Structural defects of crystalline compounds affect the performance of devices based on such materials. A dislocation structure simulation method for crystalline compounds with intermediate values of dislocation densities is proposed (∼105–106 cm−2). The influence of various defects on shape of diffuse and coherent components of intensity distributions of X-ray scattering is shown. Probable dislocation reactions are considered at block boundaries and inside of crystals. Possible dislocation system as the set of complete 60°-dislocations and partial dislocations is investigated based on Krivoglaz kinematic theory with use of Monte Carlo method.

Key words: crystalline compounds, high-resolution X-ray diffractometry, defect structure, Monte Carlo method, rocking curves, reciprocal space maps.

URL: https://mfint.imp.kiev.ua/en/abstract/v43/i10/1289.html

DOI: https://doi.org/10.15407/mfint.43.10.1289

PACS: 07.85.-m, 61.05.cc, 61.72.Lk, 61.72.Mm

Citation: I. M. Fodchuk, A. R. Kuzmin, I. I. Gutsuliak, M. S. Solodkyi, O. L. Maslyanchuk, Yu. T. Roman, V. P. Kladko, O. Yo. Gudymenko, V. B. Molodkin, and V. V. Lizunov, High-Resolution X-Ray Diffractometry of Crystalline Compounds with Developed Dislocation Structure, Metallofiz. Noveishie Tekhnol., 43, No. 10: 1289—1304 (2021) (in Ukrainian)

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