Application of Digital Analog of Increase of Resolving Power of the X-Ray Diffraction Equipment for Characterization of an Imperfect State of Crystalline Materials
N. M. Rozhenko, O. M. Grigoriev, V. V. Kartuzov
I. M. Frantsevich Institute for Problems in Materials Science, NAS of Ukraine, 3 Academician Krzhyzhanovsky Str., UA-03142 Kyiv, Ukraine
Received: 19.06.2018. Download: PDF
The technique of analysis of the x-ray patterns’ shape using Tikhonov’s regularization method to reconstruct a physical profile (i.e., radial distribution of reflection intensity, the broadening of which is caused by crystal defects only) is described. A procedure for the separation of x-ray diffraction effects on the crystal lattice with microstrains and on coherent scattering regions is proposed. It is based on the recovery of total physical profile shape, does not require a priori assumptions about a law of microstrain distribution, and allows taking into account for a broadening-function type within the areas of coherent scattering.
Key words: convolution, physical profile, crystal defects, separation of diffraction effects.
PACS: 07.85.-m, 61.05.cf, 61.05.cp, 61.72.Dd, 81.07.-b, 81.70.-q
Citation: N. M. Rozhenko, O. M. Grigoriev, and V. V. Kartuzov, Application of Digital Analog of Increase of Resolving Power of the X-Ray Diffraction Equipment for Characterization of an Imperfect State of Crystalline Materials, Metallofiz. Noveishie Tekhnol., 40, No. 9: 1149—1164 (2018) (in Ukrainian)